Method and apparatus for reading signals through a line

ABSTRACT

Circuits, methods, and systems are disclosed in which a current is provided to compensate for spurious current while receiving signals through a line. For example, the spurious current can be sensed and the compensating current can be approximately equal to the sensed spurious current. The spurious current could include photocurrent from a bright light, and the compensating current can prevent bright light effects.

FIELD OF THE INVENTION

The invention relates to techniques for receiving signals fromsignal-providing elements through a line. Particularly, the inventionrelates to methods, circuits, and systems that provide current tocompensate for spurious current while receiving signals through such aline.

BACKGROUND OF THE INVENTION

Various types of elements for providing signals through a line invarious configurations are known. For example, U.S. Pat. No. 6,204,524('524), incorporated herein by reference, describes CMOS active pixelsensor (APS) arrays and compares them to other semiconductor-basedimagers, including charge coupled devices (CCDs), photodiode arrays,charge injection devices, and hybrid focal plane arrays.

In many known configurations, a number of light sensing elements, oftencalled “pixels”, provide their signals through a conductive line,sometimes referred to herein as a “readout line”. In a row/column array,for example, each column typically has a readout line to, receivesignals from a group of pixels that includes one pixel from each row;when a row is selected, each pixel in the row can provide its signalthrough its column's readout line. As used herein, in a row/columnarray, a “row” is defined as a line of pixels or other signal-providingelements that can be concurrently selected for readout, while a “column”is defined as a line of pixels that provide their signals through ashared readout line, also referred to as a “column line”.

FIG. 1 shows circuit 100, which exemplifies features of a conventionalCMOS APS array as exemplified in '524. Circuit 100 can be implemented asintegrated circuitry on a chip. Pixel array 110 is a row/column arraywith M rows and N columns of pixels. As illustrated, pixel 112 is in oneof the rows and one of the columns; while its row is selected, pixel 112can provide signals through line 114, the readout line for its column.

Within pixel 112, photo-generated charge converted from photons ofradiant energy is transferred to region 120, and can be amplified duringtransfer. Region 120, also referred to as a floating diffusion region,is in turn connected to provide a signal to the gate of source followertransistor 122 indicating a quantity of charge in region 120. Sourcefollower transistor 122 converts the gate signal to a pixel outputvoltage. When Row switch 124, which can also be a transistor, is closedby a row select signal, the pixel output voltage results in a signal toreadout circuitry 130 through line 114.

Within readout circuitry 130, sample and hold (S/H) circuit 132 includesload transistor 134 biased by voltage VLN to provide a bias current ofappropriate magnitude for source follower transistor 122 through line114. During sampling, S/H transistor 136 can be turned on and, inresponse to the pixel output voltage from source follower transistor122, S/H capacitance 138 stores a voltage representing the amount ofcharge in diffusion region 120. The voltage stored by S/H capacitance138 can then be used to provide a signal to readout path 140 for furtherprocessing. In a typical implementation, S/H circuit 132 for line 114includes two separately switched S/H capacitances, one for signalsampling and one for reset sampling, as shown in '524.

In circuit 100 and other circuits, problems can be caused by undesiredcurrents, such as photocurrents, that affect signals provided throughlines. The term “spurious current” is used herein to mean any current ona line that, although not a genuine bias current, affects a signalprovided by a pixel or other signal-providing element through the line.

Although spurious current could result from various undesired processes,it is especially problematic in a CMOS image sensor implemented insilicon. In a CMOS image sensor, some photoelectrons generated bysilicon are not captured by the photodiode or other photosensitiveregion of any pixel. Instead, such photoelectrons can produce anundesired photocurrent on certain other nodes in the pixel circuitry. Inparticular, a very bright object can cause a significant photocurrent atthe row select transistors of many pixels in a column.

In circuit 100 in FIG. 1, for example, bright light can causephotocurrent to flow from line 114 through a parasitic diode at the openRow switch of pixel 112. As a result, the performance of source followertransistor 122 may be affected.

The main effect of photocurrent from bright light involves bias currentprovided by load transistor 134. The bias current is modified byphotocurrent in the Row select switches of pixel 112 and of other pixelsin the same column; the photocurrents may, in combination, be comparableto the bias current. Therefore, when a pixel's Row switch is closed,enabling its source follower to provide a signal through line 114, thesource follower's operation may be affected by the modified biascurrent. If the photocurrents increase the bias current, the sourcefollower may saturate at a lower threshold, and if the photocurrents aresufficiently large, the source follower gain can be substantiallyreduced. Illustratively, if a pixel normally provides a signal from 0 to1 volt, its signal might reach a maximum at 0.6 or 0.7 volts instead of1 volt. Also, gain may be reduced for all pixels in a column. Therefore,the column's readout circuitry may receive reduced signals for allpixels in the column, forming a vertical line in an image read out fromthe array.

Vertical lines and other effects resulting from intense illumination ofpixels in a row/column array or other configuration are referred toherein as “bright light effects”. As used herein, “light” includes allwavelengths of electromagnetic radiation, and the term “bright light” isused herein to encompass any source of electromagnetic radiation atsufficient intensity to produce a bright light effect, regardless of theradiation's wavelength distribution. An extended bright light effectsuch as a vertical line, if produced by an image of the sun, may becalled “sun smear”.

In addition to row/column arrays, the spurious current problem can alsoarise in other arrays and configurations in which light sensing pixelsor other signal-providing elements provide signals through readoutlines.

The invention provides techniques that alleviate the spurious currentproblem.

BRIEF SUMMARY OF THE INVENTION

The invention provides circuits, methods, and systems in which a currentis provided to compensate for spurious current while receiving signalsthrough a line. For example, the spurious current can be sensed and thecompensating current can be approximately equal to the sensed spuriouscurrent. The spurious current could include photocurrent from a brightlight, and the compensating current can prevent bright light effects.

BRIEF DESCRIPTION OF THE DRAWINGS

Additional advantages and features of the invention will be apparentfrom the following detailed description and drawings.

FIG. 1 is a schematic circuit diagram showing conventional CMOScircuitry in which light sensing pixels provide signals through readoutlines.

FIG. 2 is a schematic circuit diagram illustrating how current cancompensate for spurious current in a circuit like that of FIG. 1.

FIG. 3 is a schematic circuit diagram of a compensating circuit thatsenses spurious current in a readout line and provides a compensatingcurrent on the readout line that matches the sensed spurious current.

FIG. 4 is a timing diagram showing waveforms that occur in thecompensating circuit of FIG. 3.

FIG. 5 is a schematic block diagram showing components on a chip,including compensating circuitry.

FIG. 6 is a schematic block diagram of a system that includes a sensorchip with compensating circuitry.

DETAILED DESCRIPTION OF THE INVENTION

The following detailed description refers to the accompanying drawings,which form a part hereof and which show by way of illustration specificimplementations of the invention. These implementations are described insufficient detail to enable those skilled in the art to practice theinvention, and it is to be understood that other implementations may beutilized and that structural, logical, and electrical changes may bemade without departing from the spirit and scope of the invention. Thefollowing detailed description is, therefore, not to be taken in alimiting sense, and the claims indicate the scope of protection sought.

FIG. 2 shows circuit 160 with array 162, illustratively a row/columnimage sensing array similar to array 110 in FIG. 1. The invention isalso applicable, however, to other arrays and configurations in whichlight sensing pixels or other signal-providing elements provide signalson readout lines on which spurious current can occur.

Within array 162, light sensing pixels 166 and 168 are connected forproviding signals through column line 164. Like pixel 112 in FIG. 1,each pixel includes a source follower transistor and a row selecttransistor, illustratively shown as a Row switch. For purposes ofillustration, pixel 166 is receiving a bright light, such as at thecenter of a direct image of the sun, while pixel 168 is receiving normalimage light.

The bright light causes photocurrent I_(P) to flow from line 164 throughthe parasitic diode of the open Row switch of pixel 166, as indicated byphotocurrent sink 170. At the same time, bias current sink 172 drawsbias current I_(B) from line 164, so that the total current being drawnfrom line 164 is I_(B)+I_(Pi) for I=1 through M. In this case, spuriouscurrent includes I_(Pi), represented by combined spurious current sink174 in parallel with bias current sink 172. Spurious current sink 174 isshown in dashed lines to emphasize that it is only illustrative, merelyrepresenting a combination of photocurrents that include I_(P) throughphotocurrent sink 170. As noted above, a very bright object can causesignificant photocurrent at the select transistors of many pixelsconnected to line 164, so that I_(Pi) may be much larger than I_(Pi) ofany single pixel.

The Row switch of pixel 168 is closed to enable its source follower toprovide a signal through line 164 indicating its pixel output voltage.The bias current of the source follower is I_(B)+I_(Pi) rather thanI_(B), so that its operating range or its gain may be substantiallyreduced in the manner described above, producing a bright light effectsuch as a vertical line in an image read out from array 162.

FIG. 2 also shows a way to compensate for spurious current such asI_(Pi), alleviating the spurious current problem. In circuit 160,compensating circuitry 180 provides compensating current I_(C) to line164. By taking a current sum at node 182, it can be seen that I_(LINE),the total current on line 164 into node 182, must equal the combinationof the other currents, i.e. I_(LINE)=I_(B)+I_(Pi)−I_(C). In the idealcase for bias of the source followers, I_(LINE)=I_(B), which can onlyhold if I_(Pi)=I_(C). Therefore, a current compensating for spuriouscurrent should be at least approximately equal to the spurious current,and ideally the two would be precisely equal.

As used herein, the term “compensate”, as in “compensating for spuriouscurrent”, means to make up for the thing compensated. In other words, a“compensating current” can make up for spurious current, such as bysupplying a current with matching or approximately equal magnitude to aline from which spurious current is being drawn. Conversely, if aspurious current were being supplied to a line, a compensating currentcould be drawn from the line.

The compensation technique in FIG. 2 is applicable not only to theillustrated type of spurious current nor only to the particularsignal-providing circuitry shown for pixels 166 and 168, but could beapplied in general to lines through which any type of signal-providingelements provide signals that may be affected by any type of spuriouscurrents. Further, the positioning of compensating circuitry 180relative to array 162 and current sink 172, although convenient, ismerely illustrative, and compensating current I_(C) could be provided toline 164 at any suitable point along its length.

FIG. 3 shows circuit 200, an example of how compensating circuitry 180in FIG. 2 can be implemented. Circuit 200 can provide compensatingcurrent I_(C) on line 164 while a signal is provided, and therefore canprevent or eliminate bright light effects such as sun smear and othereffects due to spurious current. Specifically, circuit 200 can sensespurious current on readout line 164 when pixels are not providingsignals through line 164 and can provide a current to compensate for thespurious current to line 164 while a pixel is providing its signalthrough line 164. Advantageously, circuit 200 provides compensatingcurrent that is equal to the readout line's sensed spurious current to ahigh level of precision. In addition, circuit 200 includes a cascodedtransistor current source that provides a constant current that is veryinsensitive to variations in voltage on line 164, such as during signaland reset sampling.

Compensating circuit 200 can conveniently be included in readoutcircuitry 210 for an array, connected near the point at which S/Hcircuitry is connected as shown, but could alternatively be connected toline 164 in any other appropriate position. Readout circuitry 210 alsoincludes an implementation of current sink 172 in FIG. 2, which includestransistor 212, held on by voltage Vln, and Vln_enable switch 214.

Although highly suitable for a CMOS image sensor as described above,compensating circuit 200 could be applied in any other device in whichsignals provided on a line are affected by spurious current as definedabove. Because it can remove or eliminate bright light effects such assun smear, circuit 200 is especially useful in outdoor daylightsituations.

As noted above, cascoded transistors 220 and 222, p-channel transistorsin this implementation, provide a current source for circuit 200. Asused herein, the term “cascoded transistors” encompasses a configurationof two or more transistors connected in series and with one controllingthe output voltage of the next in the series.

Circuit 200 also includes sensing capacitors 224 and 226, connectedbetween supply voltage V_(DD) and the gates of transistors 220 and 222,respectively. As used herein, “sensing”, as in “sensing spuriouscurrent”, means to obtain one or more signals that indicate or includeinformation about a parameter of the thing sensed, such as the magnitudeor another value of a sensed current. Capacitors 224 and 226 obtainsignals in the form of voltage levels that cause transistors 220 and 222to provide a compensating current equal in magnitude to a spuriouscurrent; the voltage levels therefore indicate or include informationabout the spurious current's magnitude.

Several switches control compensating circuit 200, as can be understoodmore filly in relation to FIG. 4. For example, at T₀ in FIG. 4,Comp_enable switch 230 can be closed, enabling circuit 200 to beginsensing and compensating for spurious current on line 164. Similarly,Comp_enable switch 230 can be opened to stop these operations.

T₁ marks the beginning of a row's sampling cycle, during which signaland reset sampling can be performed in the conventional manner. Theremainder of FIG. 4 shows events during the cycle that begins at T₁, andthe same or similar event sequences could occur during subsequentcycles.

At T₂, Cascode_sample switch 232 and Source-sample switch 234 areclosed. Assuming Comp_enable switch 230 is closed, the closing ofCascode_sample switch 232 and Source_sample switch 234 places circuit200 in a sensing mode in which it senses spurious current on line 164.Switches 232 and 234 begin the sensing mode. by providing a connectionbetween each transistor's gate and one of its channel leads, allowingthe voltages on the gates to float to levels at which transistors 220and 222 are providing a current that balances spurious current.

At T₂, the Row switches of all pixels connected to line 164 are open,and Vln_enable switch 214 is also open. As a result, the only currentsinks connected to line 164 are spurious current sinks such as thoserepresented by spurious current sink 174 in FIG. 2 and the only currentsource connected to line 164 is cascoded transistors 220 and 222.Transistors 220 and 222 are turned off at T₁ by supply voltage V_(DD)received through capacitors 224 and 226, but are then turned on at T₂ byclosing switches 232 and 234. As discussed above, the photocurrent sinksrepresented by spurious current sink 174 can provide a spurious currentof I_(Pi), and, after an initial transient, cascoded transistors 220 and222 provide a precisely matching current I_(C)=I_(Pi), as shown in theupper waveform in FIG. 4.

While cascoded transistors 220 and 222 go through the initial transientto providing I_(C)=I_(Pi), the voltages at their gates also go through atransient, as illustrated by the second waveform in FIG. 4, showing thevoltage V_(S) across capacitor 224, which is equal to V_(DD) minus thegate voltage of transistor 220. This transient ends when V_(S) and thevoltage across capacitor 226 (not shown) reach levels at whichtransistors 220 and 222 provide I_(C)=I_(Pi), shown at T₃ in FIG. 4. AtT₃, spurious current I_(Pi) has been sensed, and values for producingI_(C)=I_(Pi) are stored in capacitors 224 and 226.

At T₄, which could for example be approximately 1 μsec after T₂,switches 232 and 234 are opened, shifting circuit 200 from the sensingmode to an operating mode m which it provides I_(C)=I_(Pi), preciselycompensating for spurious current on line 164; the operating mode cancontinue until circuit 200 is shifted back into the sensing mode, or aslong as capacitors 224 and 226 are storing accurate voltages. At T5,switch 214 is closed so that I_(LINE), the net current in line 164,rises to the appropriate bias current I_(B) for source followers toprovide signals through line 164. Further switching can then beperformed in the conventional manner to close the Row switch of a pixelwhose source follower is providing a signal in the current row cycle,and to capture the signal in S/H circuitry without any effect fromundesired photocurrent or other spurious current. Despite fluctuatingvoltages and signals on line 164 during sampling, circuit 200 continuesto provide constant compensating current I_(C)=I_(Pi) because transistor232 is isolated from voltage on line 164 due to the cascoded connectionwith transistor 234, which acts as a buffer. In a typicalimplementation, signals will be received by voltage mode read out, butother readout techniques could be used within the scope of theinvention.

When sampling is completed, switch 214 opens at T6 and I_(LINE) dropsback to zero because circuit 200 continues to compensate for spuriouscurrent on line 164. The row cycle ends and a following row cycle beginsat T7, with circuit 200 continuing to harmlessly provide I_(C)=I_(Pi)until switches 232 and 234 are again closed to begin the next sensingphase. Although capacitors 224 and 226, which control the level ofcompensating current I_(C), discharge very slowly through parasiticresistances of sampling switches 232 and 234, parasitic effects intypical implementations should be small enough to make this effectnegligible over time scales of interest, so that V_(S), and thereforeI_(C), can be treated as remaining constant until well after thefollowing row's cycle begins. Also, sampling switches 232 and 234 can beCMOS switches to reduce the effect of clock feedthrough and chargeinjection on sensing of spurious current.

Each row's cycle can begin with spurious current sensing by circuit 200,as occurs between T₂ and T₄ in FIG. 4, to ensure that any spuriouscurrent changes, such as photocurrent variations due to image changes,are reflected in the voltages across capacitors 224 and 226. This alsoensures that capacitors 224 and 226 do not discharge appreciably fromthe values necessary to compensate for spurious current, and are updatedduring each row's cycle by an upward or downward transient similar induration to the one between T₂ and T₃in FIG. 4.

Circuit 200 is particularly advantageous because it senses spuriouscurrent and provides precisely matching compensating current. Althoughit would be within the scope of the invention to compensate for spuriouscurrent less precisely, circuit 200 can achieve precise matching becausecascoded transistors 220 and 222 provide a self-biasing, highly constantcurrent source that is not sensitive to voltage variations on line 164.

Compensating circuitry 180 in FIG. 2 could be implemented in numerousways other than circuit 200. Various other types of current sourcescould be used, such as single transistor sources, sources withtransistors connected in a mirror or other configuration, and so forth.Capacitors 224 and 226 are illustrative only, and could be replaced byany appropriate component for holding a voltage or other sensed valueindicating a spurious current, including any suitable configuration ofcapacitors or equivalents. The sequence of operations in FIG. 4 couldalso be modified within the scope of the invention, such as by sensingspurious current more or less frequently relative to sampling or byadding additional modes besides the sensing and operating modes ofcircuit 200.

The compensating technique exemplified by circuit 200 could readily beapplied in other environments, such as by drawing a compensating currentfrom each readout line in an inverted or n-type circuit in whichspurious currents flow into readout lines rather than out from readoutlines as in the more conventional p-type circuits in FIGS. 2 and 3.Although the illustrated implementation is highly suitable for sensingvisible light images with a CMOS image sensor array, application tosensing of any other images in visible or invisible regions of theradiation spectrum or to sensing of other input energy sources would bewithin the scope of the invention. Examples of other possibleapplications include infrared, ultraviolet, and x-ray image sensing, andbright lights causing spurious current could be within or outside thesensing region of the spectrum.

As suggested in FIG. 3, readout circuitry 210 can include an array of Ncircuits like circuit 200, each connected to a column line from an imagesensor array. As in FIG. 1, output from readout circuitry 210 can beprovided to a suitable readout path.

Although particularly suited for integration on a substrate with a CMOSimage sensor array as described below, transistors, capacitances, andswitches as in FIG. 3 could be implemented with any appropriatestructures, including transistors, capacitors, and switching transistorsof any suitable type formed with layers of semiconductor material on anyappropriate substrate. The invention could be implemented, for example,on a GaAs substrate in which spurious currents arise due to leakage, orin other contexts in which spurious currents arise. Other possibleimplementations within the scope of the invention include, but are notlimited to, silicon-on-insulator (SOI) technology, silicon-on-sapphire(SOS) technology, doped and undoped semiconductors, epitaxial layers ofsilicon supported by a base semiconductor foundation, and othersemiconductor structures. Implementation with an absorption medium on aseparate chip, connected for example by a Ge or GaAs flip chipconnection, would also be within the scope of the invention.

FIG. 5 shows chip 250 on which readout circuitry as in FIG. 3 can beimplemented as part of an integrated image sensor circuit. Pixel array252 can be implemented as a CMOS image array as described in U.S. Pat.No. 6,204,524 ('524), incorporated by reference. Row driver 254, rowaddress decoder 256, and column address decoder 258, can also beimplemented as described in '524. Controller 260, which can be a blockof digital logic that functions as a state machine providing timingand-control signals to other components, can in part provide timing andcontrol signals as described in '524, though it also provides othersignals as described below.

Readout array 262 can be implemented as described above in relation toFIGS. 1 and 3. Within readout array 262, compensating circuitry 264 canbe implemented with an array of circuits like circuit 200 in FIG. 3.Column address decoder 258 performs N:1 multiplexing to transfer asequence of signals from readout array 262 to readout path 266, whichcan include analog processing circuitry 270, analog-to-digital (A-to-D)conversion circuitry 272, and pixel processing circuitry 274. Pixelprocessing circuitry 274 can receive digital values, correct defectivepixels, and perform color interpolation and other digital imageprocessing. Pixel processing circuitry 274 and controller 260 could bothbe implemented on a simple microprocessor on chip 250. Signals from chip250 are ultimately transferred from output buffer 276 to an externalcomputer system or other external circuitry, such as through appropriatepin connections.

Controller 260 provides signals to switches in readout array 262,including switches in compensating circuitry 264. If implemented withcircuit 200, controller 260 can provide signals to close and openswitches as described above in relation to FIG. 4.

A chip with circuitry to compensate for spurious current could beimplemented in many other ways within the scope of the invention. Also,rather than being on a single chip, some circuitry, such as the readoutarray and readout path, could be provided on one or more additionalchips rather than on the same chip with the pixel array, all within thescope of the invention.

FIG. 6 shows system 300, a typical processor based system modified toinclude an image sensor IC as in FIG. 5. Processor based systemsexemplify systems of digital circuits that could include an imagesensor. Examples of processor based systems include, without limitation,computer systems, camera systems, scanners, machine vision systems,vehicle navigation systems, video telephones, surveillance systems, autofocus systems, star tracker systems, motion detection systems, imagestabilization systems, and data compression systems for high-definitiontelevision, any of which could utilize the invention.

System 300 includes central processing unit (CPU) 302 that communicateswith various devices over bus 304. Some of the devices connected to bus304 provide communication into and out of system 300, illustrativelyincluding input/output (I/O) device 306 and image sensor IC 308. Otherdevices connected to bus 304 provide memory, illustratively includingrandom access memory (RAM) 310, hard drive 312, and one or moreperipheral memory devices such as floppy disk drive 314 and compact disk(CD) drive 316.

Image sensor 308 can be implemented as an integrated image sensorcircuit on a chip with circuitry to compensate for spurious current, asillustrated in FIG. 5. Image sensor 308 may be combined with aprocessor, such as a CPU, digital signal processor, or microprocessor,in a single integrated circuit.

As can be seen by the described implementations, the inventionencompasses methods, circuits, and systems that provide current tocompensate for spurious current, such as, e.g., spurious currentoccurring on a column line during sampling of a CMOS image array.

Although the invention has been described with specific reference torow/column arrays for image sensing, the invention has broaderapplicability and may be used in any application where signals fromsignal-providing elements may be affected by spurious current. Also,although exemplary compensating circuitry has been described andillustrated, current to compensate for spurious current could beprovided in many other ways, some of which are mentioned above.Accordingly, the methods described above are merely exemplary.

The above description and drawings illustrate implementations thatachieve the objects, features, and advantages of the invention, but itis not intended that the invention be limited to any illustrated ordescribed embodiment. Any modification that comes within the spirit andscope of the following claims should be considered part of theinvention.

1-37. (canceled)
 38. An image sensor integrated circuit comprising: arow/column array of light sensing pixels in which each column has areadout line, the array configured to receive an image including brightlight that causes photocurrent on a column's readout line, thephotocurrent being sufficient to produce a bright light effect in aresulting image; for each column, compensating circuitry connected tothe column's readout line for sensing a first current on the column'sreadout line when no pixel is providing a signal through the column'sreadout line, the sensed first current including the photocurrent; thecompensating circuitry further configured to provide a second currentcompensating for the sensed first current while a pixel is providing asignal through the column's readout line for reducing bright lighteffect in a resulting image.
 39. The integrated circuit of claim 38 inwhich the row/column array is a CMOS image sensing array.
 40. Theintegrated circuit of claim 38 in which the compensating circuitryfurther comprises: for each column, switching circuitry for switchingthe column's compensating circuitry between a sensing mode in which thecompensating circuitry senses said first current and an operating modein which the column's compensating circuitry provides the compensatingsecond current.
 41. The integrated circuit of claim 38 in which eachcolumn's compensating circuitry comprises: a set of at least twocapacitors, each of which is configured to be charged to a respectivevoltage in sensing said first current.
 42. The integrated circuit ofclaim 41 in which each column's compensating circuitry comprises aseries of at least two cascoded transistors, each with a gate connectedfor receiving voltage from a respective one of the set of capacitors;the received voltages causing the cascoded transistors to provide thecompensating second current with approximately the same magnitude as thesensed first current.
 43. The integrated circuit of claim 42 in whicheach of the cascoded transistors further has a channel lead forconnecting to the transistor's gate and its respective capacitor whilesensing said first current; the cascoded transistors configured toprovide said compensating second current that balances said firstcurrent being sensed, causing each transistor's respective capacitor toreach its voltage during sensing of said first current.
 44. A systemcomprising: a processor; and an image sensor array device connected toprovide signals to the processor; the array device comprising: arow/column array of light sensing pixels in which each column has areadout line, the array configured to receive an image including brightlight that causes photocurrent on a column's readout line, thephotocurrent being sufficient to produce a bright light effect in thecolumn; for each column, compensating circuitry connected to thecolumn's readout line for sensing a first current on the readout linewhen no pixel is providing a signal through the readout line, the sensedfirst current including the photocurrent; the compensating circuitryfurther configured to provide a second current compensating for thesensed first current while a pixel is providing a signal through thecolumn's readout line-for reducing bright light effect in the column.45. The system of claim 44 in which the image sensor array devicecomprises a CMOS image sensing IC that includes the row/column array andthe compensating circuitry.
 46. A CMOS integrated circuit comprising: aconductive line for receiving photocurrent when the integrated circuitreceives light, including bright light; and a plurality ofsignal-providing elements for providing signals through the line as aresult of said integrated circuit receiving said light, including brightlight; and compensating circuitry coupled to the conductive line, thecompensating circuitry being operable to provide compensating current tocompensate for the photocurrent on the conductive line while at leastone of the plurality of signal-providing elements is providing a signalthrough the conductive line.
 47. The integrated circuit of claim 46 inwhich the compensating circuitry comprises: a cascoded transistorcurrent source that provides the compensating current.
 48. A method ofreceiving signals from light sensing pixels in an image sensor, thepixels providing signals to a plurality of conductive lines of saidimage sensor in response to bias current on the conductive lines; themethod comprising: providing source-follower transistor bias current oneach of said plurality of conductive lines, each conductive linereceiving signals from one of the pixels via the conductive line; andproviding compensating current to compensate for photocurrent on each ofsaid plurality of conductive lines.
 49. The method of claim 48, furthercomprising, for each of said plurality of conductive lines: when none ofthe pixels is providing a signal through the conductive line, sensingthe photocurrent on the conductive line; the compensating current beingapproximately equal to the sensed photocurrent.
 50. Readout circuitryfor an image sensor circuit that includes light sensing pixels thatprovide signals on lines in response to bias current on the lines, thereadout circuitry comprising: bias current circuitry that provides biascurrent on each of the lines; and for each line, compensating circuitryconnected to the line; each line's compensating circuitry being operableto provide current to compensate for photocurrent on the line whilereceiving a signal from one of the pixels through the line.
 51. Thecircuitry of claim 50, further comprising: for each line,sample-and-hold circuitry for receiving signals through the line.
 52. Acircuit comprising: a conductive line; at least one source followertransistor for providing a signal on the conductive line in response tobias current on the conductive line; the at least one source followertransistor providing the signal in response to a photosensitive devicecoupled to said source follower transistor being exposed to light thatproduces photocurrent on the conductive line; and readout circuitry forreceiving the signal from the source follower transistor through theconductive line; the readout circuitry comprising: bias currentcircuitry for providing bias current on the conductive line; andcompensating circuitry for providing compensating current to compensatefor the photocurrent on the conductive line while said signal isreceived from said at least one source follower transistor via theconductive line.
 53. The circuit of claim 52 in which the readoutcircuitry further comprises: sample-and-hold circuitry for receivingsignals through the line.
 54. A method for operating an image sensor,the method comprising: reading out a signal from at least one pixel of apixel array via a column line of said pixel array; sensing a firstcurrent value on said column line; and supplying a second compensatingcurrent to said column line so as to reduce an adverse effect of saidfirst current when said at least one pixel is being read out.
 55. Animage sensor comprising: a pixel array having at least one column linefor reading out a signal from at least one pixel; a compensating circuitcoupled to said at least one column line for sensing a first currentvalue on said column line and for supplying a compensating current tosaid column line so as to reduce an adverse effect of said first currentwhen said at least one pixel is being read out.
 56. A method ofreceiving signals from a row/column array of light sensing pixels inwhich each column has a readout line; the method comprising: receivinglight on the array, the light including bright light that causesphotocurrent in the readout line of a column, the photocurrent beingsufficient to produce a bright light effect; when the pixels are notproviding signals through the columns' readout lines, sensing a firstcurrent on each column's readout line; the sensed first current for thecolumn including the photocurrent; and while pixels in a row areproviding signals through the columns' readout lines, providing acompensating current to compensate for said sensed first current on eachcolumn's readout line, the compensating current being approximatelyequal to the readout line's sensed first current, the compensatingcurrent preventing the bright light effect.
 57. The method of claim 56in which the bright light is the sun and the bright light effect is sunsmear.
 58. Readout circuitry for receiving signals from a row/columnarray of light sensing pixels in which each column has a readout line;the readout circuitry comprising: for each column in the array,compensating circuitry connected to the column's readout line; thecompensating circuitry for sensing a first current on each column'sreadout line when the pixels are not providing signals through thecolumns' readout lines and for providing a compensating current to eachreadout line to compensate for the sensed first current on each column'sreadout line while pixels in a row are providing signals through thecolumns' readout lines, the compensating current being approximatelyequal to the readout line's sensed first current; and such that whenbright light in an image is received on the array thus causingphotocurrent in the readout line of a column, the photocurrent beingsufficient to produce a bright light effect in the column, the sensedfirst current for the column including the photocurrent; thecompensating current is configured to prevent the bright light effect.59. A compensating circuit for compensating for a first current on aline, comprising: a self-biasing current source comprising at least twocascoded transistors; a respective capacitor connected to the gate ofeach cascoded transistors; and switch circuitry for switching thecompensating circuit between a sensing mode and an operation mode; inthe sensing mode, the current source being configured to provide acurrent to balance said first current on the line when no signals arebeing provided on the line, the capacitors being configured to reachvoltages at which the cascoded transistors provide the balancingcurrent; in the operation mode, the current source being configured toprovide current on the line to compensate for current, the cascodedtransistors being configured to provide the compensating current inresponse to the voltages from the capacitors.
 60. The compensatingcircuit of claim 59 in which the cascoded transistors are p-channeltransistors.
 61. The compensating circuit of claim 59 in which thecompensating current precisely matches the first current.
 62. An imagesensor integrated circuit comprising: a row/column array of lightsensing pixels in which each column has a readout line, the readout lineof a column having a first current when an image is received by thearray; for each column, compensating circuitry connected to the column'sreadout line for sensing said first current on the column's readout linewhen no pixel is providing a signal through the column's readout lineand for providing current compensating for the first current while apixel is providing a signal through the column's readout line, thecompensating current being approximately equal to the sensed firstcurrent.
 63. The integrated circuit of claim 62 in which the row/columnarray is a CMOS image sensing array.
 64. The integrated circuit of claim62, further comprising: for each column, a switch connected for causingthe column's compensating circuitry to sense the first current whenclosed and for causing the column's compensating circuitry to providethe compensating current when open.
 65. The integrated circuit of claim62 in which each column's compensating circuitry comprises: acapacitance; and a current source connected for supplying current to thecolumn's readout line and for producing voltage across the capacitance;when no signal-providing element is providing a signal through thereadout line, the current source being configured to supply current tobalance the readout line's first current and produce a voltage acrossthe capacitance indicating the first current's magnitude; while a pixelis providing a signal through the readout line, the current source beingconfigured to provide the compensating current in response to thevoltage across the capacitance.
 66. A system comprising: a processor;and an image sensor array device connected to provide signals to theprocessor; the array device comprising: a row/column array of lightsensing pixels in which each column has a readout line, the readout lineof a column having a first current while an image is received by thearray; for each column, compensating circuitry connected to the column'sreadout line for sensing said first current on the readout line when nopixel is providing a signal through the readout line and for providing acurrent compensating for the first current to the readout line while apixel is providing a signal through the readout line, the compensatingcurrent being approximately equal to the sensed first current.
 67. Thesystem of claim 66 in which the input array device comprises a CMOSimage sensing IC that includes the row/column array and the compensatingcircuitry.
 68. A method of receiving signals from a row/column array oflight sensing pixels; the method comprising: when the pixels are notproviding signals through the columns' readout lines, sensing a firstcurrent on each column's readout line; and while pixels in a row areproviding signals through the columns' readout lines, providing currentto compensate for said sensed first current on each column's readoutline, the compensating current being approximately equal to the readoutline's sensed first current.
 69. A CMOS image sensor array integratedcircuit, comprising: a row/column array of light sensing pixels in whicheach column has a readout line, each pixel in a column including asource follower transistor that provides signals through the column'sreadout line in response to bias current on the readout line; the arraybeing configured to receive an image including bright light that causesphotocurrent on a column's readout line, the photocurrent beingsufficient to produce a bright light effect; and readout circuitry forthe array; the readout circuitry comprising, for each column: biascircuitry for providing bias current on the column's readout line;sample-and-hold circuitry for receiving signals from pixels that arecoupled to the column through the column's readout line; andcompensating circuitry connected to the column's readout line forsensing a first bias current on the column's readout line when no pixelis providing a signal through the column's readout line, the sensedfirst bias current including the photocurrent; the compensatingcircuitry being operable to further provide current compensating for thesensed first bias current while a pixel is providing a signal throughthe column's readout line, the compensating current preventing thebright light effect; the compensating circuitry comprising: aself-biasing current source comprising at least two cascodedtransistors; a respective capacitor connected to the gate of eachcascoded transistors; and switch circuitry for switching thecompensating circuit between a sensing mode and an operation mode; inthe sensing mode, the current source being configured to provide acurrent to balance said first bias current on the line when no signalsare being provided on the line, the capacitors being configured to reachvoltages at which the cascoded transistors provide the balancingcurrent; in the operation mode, the current source being configured toprovide current on the line to compensate for said first bias current,the cascoded transistors being configured to provide the compensatingcurrent in response to the voltages from the capacitors; thecompensating current precisely matching the sensed first bias current.